Senior IC Failure Analysis Engineer

NVIDIA networking IC product engineering team is looking for a talented engineer to join our growing failure analysis team and support various activities of IC failures investigations in order to enable smooth products bring up, optimizing yield and quality, handle customer returns, and be critical part of product qualification that requires root cause finding for every failure encountered.

What You Will Be Doing

• Utilizing testers and different HW in combination with optical fault isolation techniques such as: Laser stimulations (OBIRCH, LADA, etc.), Laser probing and emission microscopy, to detect defects, chip design marginalities, process issues, etc.
• Modify test programs to fit FA requirement.
• Interpret ATPG diagnosis reports
• Based on the OFI/diagnosis findings, prepare plans for nano-probing and guide Physical FA engineers in their work and PFA plan.
• Prepare technical reports summarizing the findings.
• Development of novel and existing debug techniques.
• Working directly with the job requestors (Q&R, Foundry, physical design) and supporting teams (Test, DFT, SW, physical design).
  
  

• B.Sc. in Electrical/Computer Engineering, Physics, Materials Science, or related field with 5+ years of relevant experience; or M.Sc. with 3+ years; or Ph.D.
• Good understanding of VLSI circuit design, and/or device physics, and/or process engineering.
• Ability to work independently, and as part of a team.
• Strong sense of ownership, commitment, and responsibility
• Effective oral and written communication skills.
• Strong analytical problem solving
  
  

• Experience in Failure analysis, Si debug, ATE test development or nanoprobing
• Familiarity with ATE Test Programs, and ability to adopt Test Patterns per debug needs
• Statistical/data analysis experience (Matlab, JMP, etc.)
• Hands-on experience with different OFI techniques such as: laser stimulations, laser probing, photon emission, thermal emission
• Background with electronic test equipment: scopes, spectrum analyzers, lock-in amplifiers, parametric analyzers, VNA, TDR, etc.