עדיין מחפשים עבודה במנועי חיפוש? הגיע הזמן להשתדרג!
במקום לעבור לבד על אלפי מודעות, Jobify מנתחת את קורות החיים שלך ומציגה לך רק משרות שבאמת מתאימות לך.
מעל 80,000 משרות • 4,000 חדשות ביום
חינם. בלי פרסומות. בלי אותיות קטנות.
NVIDIA Networking IC Product Engineering team is looking for a highly skilled IC physical failure analysis (PFA) engineer to join our growing team and support PFA activities for yield improvement, product bring-up, customer returns, and product qualification. As a PFA engineer, you will own the physical failure analysis (PFA) part, develop work procedures/techniques/recipes, and perform PFA of IC’s using in-house equipment and in external labs.
What You Will Be Doing
Opera
- te dual-beam PFIB and develop workflows for the following applications:
- Site-specific cross-sectioning
- TEM sample preparation
- IC delayer
- Large scale cross-sections
- Unique sample preparation for different probing and imaging techniques
- SEM based nanoprobing techniques for fault isolation and device/cell characterization based on FA plan provided by the EFA engineers
- EBAC/EBIC/EBRICH for fault isolation
- Device and cell level measurements
- Own and lead nanoprobing activities, including method development and execution. Continuously drive improvements, stay up-to date, and collaborate with vendors on new techniques.
- Sample preparation for optical fault isolation, probing and more: use P-lapping and CNC for Si thinning and IC delayering
- BSc in Materials/chemical engineering, physics, chemistry, or related fields
- 5+ years of relevant industry experience in IC package or die level Failure Analysis.
- Ability to work and collaborate as part of a team and independently
- Self-motivated with the ability to learn alone and review the literature to find solutions to our challenges.
- Insist on high standards for high-quality samples
- Good documentation and communication skills
- Good understanding of VLSI circuit design, and/or device physics, and/or IC process engineering
- Experience with various IC delayering methods
- Background with dual beam FIB for cross-sections and preparing lamella for TEM
- Experience with SEM based nano-probing
במקום לעבור לבד על אלפי מודעות, Jobify מנתחת את קורות החיים שלך ומציגה לך רק משרות שבאמת מתאימות לך.
מעל 80,000 משרות • 4,000 חדשות ביום
חינם. בלי פרסומות. בלי אותיות קטנות.