Note: By applying to this position you will have an opportunity to share your preferred working location from the following: Tel Aviv, Israel; Haifa, Israel.Minimum qualifications:
- Bachelor's degree in Electrical Engineering, Computer Engineering, or a related field, or equivalent practical experience.
- 2 years of experience in Automatic Test Pattern Generation (ATPG) methods.
- Experience with multiple projects in Design for Testing (DFT) scan design and verification.
- Experience with Design for Testing (DFT) techniques and tools, Application-Specific Integrated Circuit (ASIC) Design for Testing synthesis, simulation, and verification flow.
- Master's degree in Electrical Engineering.
- Experience working with Automated Test Equipment (ATE) engineers (e.g., silicon bring-up, patterns generation, debug, validation on automatic test equipment, debug of silicon issues).
- Experience in System on a chip (SoC) cycles, including silicon bringup and silicon debug activities.
- Experience in IP integration (e.g., memories, test controllers, Test Access Point (TAP), and Memory Built-In Self Test (MBIST)).
- Experience in fault modeling.
In this role, you will play a crucial role in Design for Testing (DFT), and support devices to production. You will be responsible for developing flows, automation, and methodology, executing DFT activities. You will be responsible for testing vectors end to end, from generating DFT content, debugging to coverage goals, simulating it at gate level, sign-off DFT to tapeout, and debugging results.
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Responsibilities
- Execute activities in the design, implementation, and verification of Design for Testing (DFT) solutions for Application-Specific Integrated Circuit (ASICs).
- Develop DFT strategy for hierarchical DFT, Scan, and Automatic Test Pattern Generation (ATPG).
- Perform ATPG scan, cover debug and motivate design fixes for coverage and quality improvements.
- Perform scan verification at Register-Transfer Level (RTL) and gate level.
- Work with other Engineering teams (e.g., Design, Verification, Physical Design) to ensure that DFT Scan requirements are met and mutual dependencies are managed.
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